On enumeration of catastrophic fault patterns
Information Processing Letters
Information Processing Letters
On characterization of catastrophic faults in two-dimensional VLSI arrays
Integration, the VLSI Journal
Characterization, testing and reconfiguration of faults in mesh networks
Integration, the VLSI Journal
Information Processing Letters
Reliability of VLSI linear arrays with redundant links
IWDC'04 Proceedings of the 6th international conference on Distributed Computing
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