On characterization of catastrophic faults in two-dimensional VLSI arrays

Authors:
Soumen Maity;Amiya Nayak;Bimal K. Roy
Affiliations:
Department of Mathematics, Indian Institute of Technology, Guwahati 781 039, Assam, India;School of Information Technology and Engineering, University of Ottawa, 800 King Edward Avenue, Ottawa, ON, K1N 6N5, Canada;Applied Statistics Unit, Indian Statistical Institute, 203 B.T. Road, Calcutta 700 108, India
Venue:
Integration, the VLSI Journal
Year:
2004

Citing 7
Cited 3

A fault tolerant massively parallel processing architecture

Journal of Parallel and Distributed Computing
Efficient construction of catastrophic patterns for VLSI reconfigurable arrays

Integration, the VLSI Journal
Counting the number of fault patterns in redundant VLSI arrays

Information Processing Letters
On testing for catastrophic faults in reconfigurable arrays with arbitrary link redundancy

Integration, the VLSI Journal
Catastrophic faults in reconfigurable systolic linear arrays

Discrete Applied Mathematics
Testing and reconfiguration of VLSI linear arrays

Theoretical Computer Science
DAP—a distributed array processor

ISCA '73 Proceedings of the 1st annual symposium on Computer architecture

Characterization, testing and reconfiguration of faults in mesh networks

Integration, the VLSI Journal
On fault tolerance of two-dimensional mesh networks

ICDCN'06 Proceedings of the 8th international conference on Distributed Computing and Networking
On reliability analysis of forward loop forward hop networks

ICDCIT'06 Proceedings of the Third international conference on Distributed Computing and Internet Technology

Quantified Score

Hi-index	0.00

Visualization

Abstract

The catastrophic fault pattern (CFP) is a pattern of faults occurring at strategic locations that may render a system unusable regardless of its component redundancy and of its reconfiguration capabilities. In this paper, we extend the characterization of catastrophic fault patterns known for linear arrays to two-dimensional VLSI arrays in which all links are bidirectional. We determine the minimum number of faults required for a fault pattern to be catastrophic. The width of a fault pattern must fall within precise bounds for the pattern to be catastrophic. We outline an algorithm for the construction of a CFP with the maximum width for a given link redundancy. This algorithm gives us the framework for achieving specific upper and exact bounds on the width of CFP for a given link configuration. We give necessary and sufficient conditions for a fault pattern to be catastrophic with respect to a link redundancy. Finally we provide an algorithm to test whether a given fault pattern is catastrophic with respect to a link redundancy.