A comprehensive physical model for light reflection
Proceedings of the 18th annual conference on Computer graphics and interactive techniques
Measuring and modeling anisotropic reflection
SIGGRAPH '92 Proceedings of the 19th annual conference on Computer graphics and interactive techniques
Non-linear approximation of reflectance functions
Proceedings of the 24th annual conference on Computer graphics and interactive techniques
A Reflectance Model for Computer Graphics
ACM Transactions on Graphics (TOG)
An anisotropic phong BRDF model
Journal of Graphics Tools
Models of light reflection for computer synthesized pictures
SIGGRAPH '77 Proceedings of the 4th annual conference on Computer graphics and interactive techniques
A data-driven reflectance model
ACM SIGGRAPH 2003 Papers
Efficient BRDF importance sampling using a factored representation
ACM SIGGRAPH 2004 Papers
Barycentric Parameterizations for Isotropic BRDFs
IEEE Transactions on Visualization and Computer Graphics
The halfway vector disk for BRDF modeling
ACM Transactions on Graphics (TOG)
Inverse shade trees for non-parametric material representation and editing
ACM SIGGRAPH 2006 Papers
Realistic materials in computer graphics
SIGGRAPH '05 ACM SIGGRAPH 2005 Courses
Principles of appearance acquisition and representation
ACM SIGGRAPH 2008 classes
Physically Based Rendering, Second Edition: From Theory To Implementation
Physically Based Rendering, Second Edition: From Theory To Implementation
Experimental analysis of BRDF models
EGSR'05 Proceedings of the Sixteenth Eurographics conference on Rendering Techniques
Practical SVBRDF capture in the frequency domain
ACM Transactions on Graphics (TOG) - SIGGRAPH 2013 Conference Proceedings
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This article presents two new parametric models of the Bidirectional Reflectance Distribution Function (BRDF), one inspired by the Rayleigh-Rice theory for light scattering from optically smooth surfaces, and one inspired by micro-facet theory. The models represent scattering from a wide range of glossy surface types with high accuracy. In particular, they enable representation of types of surface scattering which previous parametric models have had trouble modeling accurately. In a study of the scattering behavior of measured reflectance data, we investigate what key properties are needed for a model to accurately represent scattering from glossy surfaces. We investigate different parametrizations and how well they match the behavior of measured BRDFs. We also examine the scattering curves which are represented in parametric models by different distribution functions. Based on the insights gained from the study, the new models are designed to provide accurate fittings to the measured data. Importance sampling schemes are developed for the new models, enabling direct use in existing production pipelines. In the resulting renderings we show that the visual quality achieved by the models matches that of the measured data.