Face Recognition: The Problem of Compensating for Changes in Illumination Direction
IEEE Transactions on Pattern Analysis and Machine Intelligence
A multigrid tutorial: second edition
A multigrid tutorial: second edition
From Few to Many: Illumination Cone Models for Face Recognition under Variable Lighting and Pose
IEEE Transactions on Pattern Analysis and Machine Intelligence
Digital Image Processing
IEEE Transactions on Pattern Analysis and Machine Intelligence
Lambertian Reflectance and Linear Subspaces
IEEE Transactions on Pattern Analysis and Machine Intelligence
Multilinear Analysis of Image Ensembles: TensorFaces
ECCV '02 Proceedings of the 7th European Conference on Computer Vision-Part I
What is the set of images of an object under all possible lighting conditions?
CVPR '96 Proceedings of the 1996 Conference on Computer Vision and Pattern Recognition (CVPR '96)
Journal of Cognitive Neuroscience
An image preprocessing algorithm for illumination invariant face recognition
AVBPA'03 Proceedings of the 4th international conference on Audio- and video-based biometric person authentication
The BANCA database and evaluation protocol
AVBPA'03 Proceedings of the 4th international conference on Audio- and video-based biometric person authentication
A comparison of photometric normalisation algorithms for face verification
FGR' 04 Proceedings of the Sixth IEEE international conference on Automatic face and gesture recognition
Multigrid anisotropic diffusion
IEEE Transactions on Image Processing
CIARP'07 Proceedings of the Congress on pattern recognition 12th Iberoamerican conference on Progress in pattern recognition, image analysis and applications
Illumination invariant face recognition by non-local smoothing
BioID_MultiComm'09 Proceedings of the 2009 joint COST 2101 and 2102 international conference on Biometric ID management and multimodal communication
On design and optimization of face verification systems that are smart-card based
Machine Vision and Applications - Integrated Imaging and Vision Techniques for Industrial Inspection
Hi-index | 0.00 |
Further to previous work showing the superiority of the pre-processing algorithm developed by Gross and Brajovic, we propose improvements that remove the need for parameter selection. In extensive experimentation on the XM2VTS database, the Yale B database and the BANCA database, we show that our method of automatic parameter selection can produce better results than setting the parameter to a single value for the whole database.