Survey of Low-Power Testing of VLSI Circuits
IEEE Design & Test
An analysis of power reduction techniques in scan testing
Proceedings of the IEEE International Test Conference 2001
Efficient compression and application of deterministic patterns in a logic BIST architecture
Proceedings of the 40th annual Design Automation Conference
A Gated Clock Scheme for Low Power Scan Testing of Logic ICs or Embedded Cores
ATS '01 Proceedings of the 10th Asian Test Symposium
Minimizing Power Consumption in Scan Testing: Pattern Generation and DFT Techniques
ITC '04 Proceedings of the International Test Conference on International Test Conference
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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Scan architectures, though widely used in modern designs for testing purpose, are expensive in power consumption. In this paper, we first discuss the issues of excessive peak power consumption during scan testing. We next show that taking care of high current levels during the test cycle is highly relevant so as to avoid noise phenomena such as IR-drop or Ground Bounce. Next, we discuss a set of possible solutions to minimize peak power during all test cycles of a scan testing process. These solutions cover power-aware design solutions, scan chain stitching techniques and pattern modification heuristics.