Predictive reachability using a sample-based approach

Authors:
Debashis Sahoo;Jawahar Jain;Subramanian K. Iyer;David Dill;E. Allen Emerson
Affiliations:
Stanford University, Stanford, CA;Fujitsu Lab. of America;University of Texas at Austin, Austin, TX;Stanford University, Stanford, CA;University of Texas at Austin, Austin, TX
Venue:
CHARME'05 Proceedings of the 13 IFIP WG 10.5 international conference on Correct Hardware Design and Verification Methods
Year:
2005

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Abstract

BDD based reachability methods suffer from lack of robustness in performance, whereby it is difficult to estimate which one should be adopted for a given problem. We present a novel approach that examines a few short samples of the computation leading to an automatic, robust and modular way of reconciling the various methods for reachability. Our approach is able to intelligently integrate diverse reachability techniques such that each method can possibly get enhanced in efficiency. The method is in many cases orders of magnitude more efficient and it finishes all the invariant checking properties in VIS-Verilog benchmarks.