An affine invariant of parallelograms and its application to camera calibration and 3d reconstruction

Authors:
F. C. Wu;F. Q. Duan;Z. Y. Hu
Affiliations:
National Laboratory of Pattern Recognition, Institute of Automation, Chinese Academy of Sciences, Beijing, P.R. China;National Laboratory of Pattern Recognition, Institute of Automation, Chinese Academy of Sciences, Beijing, P.R. China;National Laboratory of Pattern Recognition, Institute of Automation, Chinese Academy of Sciences, Beijing, P.R. China
Venue:
ECCV'06 Proceedings of the 9th European conference on Computer Vision - Volume Part II
Year:
2006

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Abstract

In this work, a new affine invariant of parallelograms is introduced, and the explicit constraint equations between the intrinsic matrix of a camera and the similar invariants of a parallelogram or a parallelepiped are established using this affine invariant. Camera calibration and 3D reconstruction from parallelograms are systematically studied based on these constraints. The proposed theoretical results and algorithms have wide applicability as parallelograms and parallelepipeds are not rare in man-made scenes. Experimental results on synthetic and real images validate the proposed approaches.