Software controlled cell bit-density to improve NAND flash lifetime

  • Authors:
  • Xavier Jimenez;David Novo;Paolo Ienne

  • Affiliations:
  • Ecole Polytechnique Fédérale de Lausanne (EPFL), Lausanne, Switzerland;Ecole Polytechnique Fédérale de Lausanne (EPFL), Lausanne, Switzerland;Ecole Polytechnique Fédérale de Lausanne (EPFL), Lausanne, Switzerland

  • Venue:
  • Proceedings of the 49th Annual Design Automation Conference
  • Year:
  • 2012

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Abstract

Hybrid flash architectures combine static partitions in Single Level Cell (SLC) mode with partitions in Multi Level Cell (MLC) mode. Compared to MLC-only solutions, the former exploits fast and short random writes while the latter brings large capacity. On the whole, one achieves an overall tangible performance improvement for a moderate extra cost. Yet, device lifetime is an important aspect often overlooked. In this paper, we show how a dynamic SLC-MLC scheme provides significant lifetime improvement (up to 10 times) at no cost compared to any classic static SLC-MLC partitioning based on any state of the art Flash Translation Layer policy.