Graph theoretic characterization and reliability of the multiple-clique network

Authors:
Wen-Shyong Hsieh;Chu-Sing Yang;Jih-Shaw Tzeng
Affiliations:
Department of Electrical Engineering, National Sun Yat-sen University, Kaohsiung, Taiwan, R.O.C. and Department of Electrical Engineering, National Cheng Kung University, Tainan, Taiwan, R.O.C.;Department of Electrical Engineering, National Sun Yat-sen University, Kaohsiung, Taiwan, R.O.C.;Department of Electrical Engineering, National Cheng Kung University, Tainan, Taiwan, R.O.C.
Venue:
Mathematical and Computer Modelling: An International Journal
Year:
1990

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Abstract

In this paper, a general class of multiple-clique structures is presented. The interconnection is based on a mixed radix number system that results in a variety of multiple-clique structures for a given number of processors N = x' . 2^y, where x and y are positive integers. A number of interested properties of the network are presented. By a constructive method, the node connectivity of the multiple-clique network is found. We then show that the graph is super-@l and is an optimal reliable structure for interconnection networks. The structure also possesses many other useful properties, such as small average message distance, Hamiltonian, point transitive, etc.