Fault Diagnosis in a Boolean n Cube Array of Microprocessors

  • Authors:
  • J. R. Armstrong;F. G. Gray

  • Affiliations:
  • Department of Electrical Engineering, Virginia Polytechnic Institute and the State University of Virginia;-

  • Venue:
  • IEEE Transactions on Computers
  • Year:
  • 1981

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Abstract

Fault- tolerant characteristics of a Boolean n cube array of microprocessors are analyzed. Connectivity properties of the network graph are used to show that n processor or link failures are required to isolate a processor. For processor failures the network is shown to be n (one step) diagnosable. A testing algorithm is presented which can diagnose up to n processor failures.