VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
Fault Macromodeling for Analog/Mixed-Signal Circuits
ITC '97 Proceedings of the 1997 IEEE International Test Conference
Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
ICCD '05 Proceedings of the 2005 International Conference on Computer Design
Hierarchical analysis of process variation for mixed-signal systems
Proceedings of the 2005 Asia and South Pacific Design Automation Conference
Journal of Electronic Testing: Theory and Applications
Parametric variability analysis for multistage analog circuits using analytical sensitivity modeling
ACM Transactions on Design Automation of Electronic Systems (TODAES)
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A methodology is presented for deriving statistical models of analog and digital circuit cells at the behavioral level. These models can be combined in a single simulation environment for efficient yield estimation of large circuits. The motivation is the growing importance of mixed analog/digital ASICs and the impracticality of traditional approaches to tolerance analysis based on computationally intensive device-level simulation. An efficient method of mapping from device-level space to behavioral space which requires no a priori assumption about the analytical mapping is presented. The method is demonstrated using an operational amplifier example. By combining the mapping with statistical methods, tolerance information is included in the behavioral model. A statistical model giving the mean, standard deviation, and correlation of behavioral parameters is obtained. Hence the tolerance analysis problem can be defined at the behavioral level of simulation and the statistical behavioral models combined to estimate the variation of system level performance. This hierarchical methodology is demonstrated using a two-stage flash analog-to-digital converter circuit. Compared to device-level simulation, a fifteen-fold gain in efficiency, and accuracy to within 2% were achieved in the yield estimate using a static performance specification