Stratified random sampling for power estimation

  • Authors:
  • Chih-Shun Ding;Qing Wu;Cheng-Ta Hsieh;M. Pedram

  • Affiliations:
  • Rockwell Semicond. Syst., Newport Beach, CA;-;-;-

  • Venue:
  • IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
  • Year:
  • 2006

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Abstract

In this paper, we present new statistical sampling techniques for performing power estimation at the circuit level. These techniques first transform the power estimation problem to a survey sampling problem, and then apply stratified random sampling to improve the efficiency of sampling. The stratification is based on a low-cost predictor, such as the zero-delay power estimate. We also propose a two-stage stratified sampling technique to handle very long initial sequences. Experimental results show that the efficiency of stratified random sampling and two-stage stratified sampling techniques are 3-10 times higher than that of simple random sampling and the Markov-based Monte Carlo simulation techniques