Software-based diagnosis for processors
Proceedings of the 39th annual Design Automation Conference
A Symbolic Inject-and-Evaluate Paradigm for Byzantine Fault Diagnosis
Journal of Electronic Testing: Theory and Applications
An Improved Fault Diagnosis Algorithm Based on Path Tracing with Dynamic Circuit Extraction
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Diagnostic Test Generation for Sequential Circuits
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Accurate Whole-Chip Diagnostic Strategy for Scan Designs with Multiple Faults
Journal of Electronic Testing: Theory and Applications
Layout-based defect-driven diagnosis for intracell bridging defects
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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A new diagnostic fault simulator is described that diagnoses both feedback and nonfeedback bridge faults in combinational circuits while using information from fault simulation of single stuck-at faults. A realistic fault model is used which considers the existence of the Byzantine Generals problem. Sets representing nodes possibly involved in a defect are partitioned based on logic and fault simulation of failing vectors. The approach has been demonstrated for two-line bridge faults on several large combinational benchmark circuits containing Boolean primitives and has achieved over 98% accuracy for nonfeedback bridge faults and over 85% accuracy for feedback bridge faults with good diagnostic resolution