Memory fault diagnosis by syndrome compression
Proceedings of the conference on Design, automation and test in Europe
Diagnostic Data Compression Techniques for Embedded Memories with Built-In Self-Test
Journal of Electronic Testing: Theory and Applications
Testing and Diagnosis Methodologies for Embedded Content Addressable Memories
Journal of Electronic Testing: Theory and Applications
Testing comparison faults of ternary CAMs based on comparison faults of binary CAMs
Proceedings of the 2005 Asia and South Pacific Design Automation Conference
Built-in self-repair schemes for flash memories
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Testing comparison and delay faults of TCAMs with asymmetric cells
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Modeling and testing of faults in TCAMs
AsiaSim'04 Proceedings of the Third Asian simulation conference on Systems Modeling and Simulation: theory and applications
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Functional tests for content-addressable memories (CAM's) are presented in this paper. In addition to several traditional functional fault models for RAM's, we also consider the fault models based on physical defects, such as shorts between two circuit nodes and transistor stuck-on and stuck open faults. Accordingly, several functional fault models are proposed. In order to make our approach suited to various application-specific CAM's, we propose tests which require only three fundamental types of operation (i.e., write, erase, and compare), and the test results can be observed entirely from the single-bit Hit output. A complete, compact test is also proposed, which has low complexity and is suitable for modern high-density and large-capacity CAMs-it requires only 2N+3w+2 compare operations and 8N write operations to cover the functional fault models discussed, where N is the number of words and w is the word length