Closed-form expressions of distributed RLC interconnects for analysis of on-chip inductance effects
Proceedings of the 41st annual Design Automation Conference
A General S-Domain Hierarchical Network Reduction Algorithm
Proceedings of the 2003 IEEE/ACM international conference on Computer-aided design
RCLK-VJ network reduction with Hurwitz polynomial approximation
ASP-DAC '03 Proceedings of the 2003 Asia and South Pacific Design Automation Conference
Wideband modeling of RF/Analog circuits via hierarchical multi-point model order reduction
Proceedings of the 2005 Asia and South Pacific Design Automation Conference
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Power characteristics of inductive interconnect
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Fast algorithms for IR voltage drop analysis exploiting locality
Proceedings of the 48th Design Automation Conference
Efficient algorithms for fast IR drop analysis exploiting locality
Integration, the VLSI Journal
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A method is introduced to evaluate time domain signals within RLC trees with arbitrary accuracy in response to any input signal. This method depends on finding a low frequency reduced-order transfer function by direct truncation of the exact transfer function at different nodes of an RLC tree. The method is numerically accurate for any order of approximation, which permits approximations to be determined with a large number of poles appropriate for approximating RLC trees with underdamped responses. The method is computationally efficient with a complexity linearly proportional to the number of branches in an RLC tree. A common set of poles is determined that characterizes the responses at all of the nodes of an RLC tree which further enhances the computational efficiency. Stability is guaranteed by the DTT method for low-order approximations with less than five poles. Such low-order approximations are useful for evaluating monotone responses exhibited by RC circuits