Diagnosis of multiple-voltage design with bridge defect
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Process variation-aware test for resistive bridges
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Gate-sizing-based single Vdd test for bridge defects in multivoltage designs
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Test cost reduction for multiple-voltage designs with bridge defects through gate-sizing
Proceedings of the Conference on Design, Automation and Test in Europe
Testing for SoCs with advanced static and dynamic power-management capabilities
Proceedings of the Conference on Design, Automation and Test in Europe
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A key design constraint of circuits used in hand-held devices is the power consumption, mainly due to battery-life limitations. Adaptive power management (APM) techniques aim at increasing the battery life of such devices by adjusting the supply voltage and operating frequency, and thus the power consumption, according to the workload. Testing for resistive bridging defects in APM-enabled designs raises a number of challenges due to their complex analog behavior. Testing at more than one supply voltage setting can be employed to improve defect coverage in such systems; however, switching between several supply voltage settings has a detrimental impact on the overall cost of test. This paper proposes a multi- automatic test generation method which delivers 100% resistive bridging defect coverage and also a way of reducing the number of supply voltage settings required during test through test point insertion. The proposed techniques have been experimentally validated using a number of benchmark circuits.