Scan-chain partition for high test-data compressibility and low shift power under routing constraint
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
LFSR-based test-data compression with self-stoppable seeds
Proceedings of the Conference on Design, Automation and Test in Europe
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems - Special section on the ACM IEEE international conference on formal methods and models for codesign (MEMOCODE) 2009
Test data compression using efficient bitmask and dictionary selection methods
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Test Data Compression Using Selective Sparse Storage
Journal of Electronic Testing: Theory and Applications
Test data compression using interval broadcast scan for embedded cores
Microelectronics Journal
Test-data volume and scan-power reduction with low ATE interface for multi-core SoCs
Proceedings of the International Conference on Computer-Aided Design
A modified scheme for simultaneous reduction of test data volume and testing power
VDAT'12 Proceedings of the 16th international conference on Progress in VLSI Design and Test
Virtual scan chains reordering using a RAM-based module for high test compression
Microelectronics Journal
Efficient Test Compression Technique for SoC Based on Block Merging and Eight Coding
Journal of Electronic Testing: Theory and Applications
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A new statistical test data compression method that is suitable for IP cores of an unknown structure with multiple scan chains is proposed in this paper. Huffman, which is a well-known fixed-to-variable code, is used in this paper as a variable-to-variable code. The precomputed test set of a core is partitioned into variable-length blocks, which are, then, compressed by an efficient Huffman-based encoding procedure with a limited number of codewords. To increase the compression ratio, the same codeword can be reused for encoding compatible blocks of different sizes. Further compression improvements can be achieved by using two very simple test set transformations. A simple and low-overhead decompression architecture is also proposed.