High-Level Test Generation for VLSI
Computer
Contest: a concurrent test generator for sequential circuits
DAC '88 Proceedings of the 25th ACM/IEEE Design Automation Conference
Experience in functional-level test generation and fault coverage in a silicon compiler
EURO-DAC '90 Proceedings of the conference on European design automation
An Hybrid Soft Computing Approach for Automated Computer Design
Proceedings of the 2006 conference on STAIRS 2006: Proceedings of the Third Starting AI Researchers' Symposium
Experience learning in model-based diagnostic systems
IJCAI'89 Proceedings of the 11th international joint conference on Artificial intelligence - Volume 2
Hierarchical test generation using precomputed tests for modules
ITC'88 Proceedings of the 1988 international conference on Test: new frontiers in testing
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