Constellation models for sketch recognition

  • Authors:
  • D. Sharon;M. Van De Panne

  • Affiliations:
  • University of British Columbia;University of British Columbia

  • Venue:
  • SBM'06 Proceedings of the Third Eurographics conference on Sketch-Based Interfaces and Modeling
  • Year:
  • 2006

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Abstract

Sketch-based modeling shares many of the difficulties of the branch of computer vision that deals with single image interpretation. Most obviously, they must both identify the parts observed in a given 2D drawing or image.We draw on constellation models first proposed in the computer vision literature to develop probabilistic models for object sketches, based on multiple example drawings. These models are then applied to estimate the most-likely labels for a new sketch. A multi-pass branch-and-bound algorithm allows well-formed sketches to be quickly labelled, while still supporting the recognition of more ambiguous sketches. Results are presented for five classes of objects.