Wattch: a framework for architectural-level power analysis and optimizations
Proceedings of the 27th annual international symposium on Computer architecture
Modeling and analysis of leakage power considering within-die process variations
Proceedings of the 2002 international symposium on Low power electronics and design
Computational Methods for Inverse Problems
Computational Methods for Inverse Problems
The Pentium Chronicles: The People, Passion, and Politics Behind Intel's Landmark Chips (Software Engineering "Best Practices")
Proceedings of the 39th Annual IEEE/ACM International Symposium on Microarchitecture
Many-core design from a thermal perspective
Proceedings of the 45th annual Design Automation Conference
Discrete Inverse Problems: Insight and Algorithms
Discrete Inverse Problems: Insight and Algorithms
Consistent runtime thermal prediction and control through workload phase detection
Proceedings of the 47th Design Automation Conference
Post-silicon power characterization using thermal infrared emissions
Proceedings of the 16th ACM/IEEE international symposium on Low power electronics and design
Focal-plane-arrays and CMOS readout techniques of infrared imaging systems
IEEE Transactions on Circuits and Systems for Video Technology
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We propose a new methodology for post-silicon power validation using the captured thermal infrared emissions from the back-side of operational integrated circuits. We first identify the challenges associated with thermal to power inversion, and then we address these challenges by devising a quadratic optimization formulation that incorporates Tikhonov filtering techniques to find the most accurate power maps. To validate our methodology, a programmable circuit of micro-heaters is implemented to create a number of reference power maps. The thermal emissions from the circuit are captured using an infrared camera and then inverted to yield highly accurate post-silicon power maps.