Reliable and adaptive network-on-chip architectures for cyber physical systems

Authors:
Diana Göhringer;Lukas Meder;Oliver Oey;Jürgen Becker
Affiliations:
Fraunhofer IOSB, Germany;ITIV, Karlsruhe Institute of Technology (KIT), Germany;ITIV, Karlsruhe Institute of Technology (KIT), Germany;ITIV, Karlsruhe Institute of Technology (KIT), Germany
Venue:
ACM Transactions on Embedded Computing Systems (TECS) - Special section on ESTIMedia'12, LCTES'11, rigorous embedded systems design, and multiprocessor system-on-chip for cyber-physical systems
Year:
2013

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Abstract

Reliability in embedded systems is crucial for many application domains. Especially, for safety critical application, as they can be found in the automotive and avionic domain, a high reliability has to be ensured. The technology in chip production undergoes a steady shrinking process from nowadays 25 nanometers. It is proven that coming technologies, which are much smaller, can have a higher defect rate after production, but also at runtime. The physical effects at runtime come from a higher susceptibility for radiation. Since the silicon die of a field programmable gate array (FPGA) includes a high amount of physical wiring, the radiation effect plays here a major role. Therefore, this article describes an approach of a reliable Network-on-Chip (NoC) which can be used for an FPGA-based system. The article describes the concept and the physical realization of this NoC and evaluates its reliability.