Partial scan flip-flop selection by use of empirical testability

Full scan fault coverage with partial scan

DATE '99 Proceedings of the conference on Design, automation and test in Europe

Partial Scan Using Multi-Hop State Reachability Analysis

VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium

Using a software testing technique to identify registers for partial scan implementation

SBCCI '06 Proceedings of the 19th annual symposium on Integrated circuits and systems design

A New Design-for-Testability Method Based on Thru-Testability

Journal of Electronic Testing: Theory and Applications