A Partial Scan Method for Sequential Circuits with Feedback
IEEE Transactions on Computers
An analytical approach to the partial scan problem
Journal of Electronic Testing: Theory and Applications
An exact algorithm for selecting partial scan flip-flops
DAC '94 Proceedings of the 31st annual Design Automation Conference
Partial scan flip-flop selection by use of empirical testability
Journal of Electronic Testing: Theory and Applications - Special issue on partial scan methods
Testability-based partial scan analysis
Journal of Electronic Testing: Theory and Applications - Special issue on partial scan methods
An optimal algorithm for cycle breaking in directed graphs
Journal of Electronic Testing: Theory and Applications - Special issue on partial scan methods
A three-stage partial scan design method to ease ATPG
Journal of Electronic Testing: Theory and Applications - Special issue on partial scan methods
Partial scan design based on circuit state information
DAC '96 Proceedings of the 33rd annual Design Automation Conference
Designing Circuits with Partial Scan
IEEE Design & Test
Classification of Faults in Synchronous Sequential Circuits
IEEE Transactions on Computers
A New Method for Partial Scan Design Based on Propagation and Justification Requirements of Faults
Proceedings of the IEEE International Test Conference on Driving Down the Cost of Test
Partial Scan Design Based on State Transition Modeling
Proceedings of the IEEE International Test Conference on Test and Design Validity
A Global Algorithm for the Partial Scan Design Problem Using Circuit State Information
Proceedings of the IEEE International Test Conference on Test and Design Validity
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
MIX: A Test Generation System for Synchronous Sequential Circuits
VLSID '98 Proceedings of the Eleventh International Conference on VLSI Design: VLSI for Signal Processing
Partial Scan Selection Based on Dynamic Reachability and Observability Information
VLSID '98 Proceedings of the Eleventh International Conference on VLSI Design: VLSI for Signal Processing
Peripheral Partitioning and Tree Decomposition for Partial Scan
VLSID '98 Proceedings of the Eleventh International Conference on VLSI Design: VLSI for Signal Processing
On Finding Undetectable and Redundant Faults in Synchronous Sequential Circuits
ICCD '98 Proceedings of the International Conference on Computer Design
On undetectable faults in partial scan circuits
Proceedings of the 2002 IEEE/ACM international conference on Computer-aided design
Application of Tools Developed at the University of Iowa to ITC-99 Benchmarks
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Partial Scan Design Based on Circuit State Information and Functional Analysis
IEEE Transactions on Computers
Using a software testing technique to identify registers for partial scan implementation
SBCCI '06 Proceedings of the 19th annual symposium on Integrated circuits and systems design
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Eliminating the Timing Penalty of Scan
Journal of Electronic Testing: Theory and Applications
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