On undetectable faults in partial scan circuits

Authors:
Irith Pomeranz;Sudhakar M. Reddy
Affiliations:
Purdue University, W. Lafayette, IN;University of Iowa, Iowa City, IA
Venue:
Proceedings of the 2002 IEEE/ACM international conference on Computer-aided design
Year:
2002

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Abstract

We provide a definition of undetectable faults in partial scan circuits under a test application scheme where a test consists of primary input vectors applied at-speed between scan operations. We also provide sufficient conditions for a fault to be undetectable under this test application scheme. We present experimental results on finite-state machine benchmarks to demonstrate the effectiveness of these conditions in identifying undetectable faults.