Gate-level test generation for sequential circuits
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Identifying sequential redundancies without search
DAC '96 Proceedings of the 33rd annual Design Automation Conference
Sequential redundancy identification using recursive learning
Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design
Identification of unsettable flip-flops for partial scan and faster ATPG
Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design
Synthesis for Testability of Highly Complex Controllers by Functional Redundancy Removal
IEEE Transactions on Computers
Hybrid Fault Simulation for Synchronous Sequential Circuits
Journal of Electronic Testing: Theory and Applications
FILL and FUNI: algorithms to identify illegal states and sequentially untestable faults
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Simulation-Based Engineering for Industrial Competitive Advantage
IEEE Design & Test
On undetectable faults in partial scan circuits
Proceedings of the 2002 IEEE/ACM international conference on Computer-aided design
8.4 Undetectable Fault Removal of Sequential Circuits Based on Unreachable States
VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium
On test generation by input cube avoidance
Proceedings of the conference on Design, automation and test in Europe
Dynamic test compaction for a random test generation procedure with input cube avoidance
Proceedings of the 2009 Asia and South Pacific Design Automation Conference
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