Full scan fault coverage with partial scan
DATE '99 Proceedings of the conference on Design, automation and test in Europe
ITEM: an iterative improvement test generation procedure for synchronous sequential circuits
GLSVLSI '01 Proceedings of the 11th Great Lakes symposium on VLSI
Cost-Driven Ranking of Memory Elements for Partial Intrusion
IEEE Design & Test
15.3 Partial Reset and Scan for Flip-Flops Based on States Requirement for Test Generation
VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium
Partial Scan Using Multi-Hop State Reachability Analysis
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
Partial Scan Design Based on Circuit State Information and Functional Analysis
IEEE Transactions on Computers
Eliminating the Timing Penalty of Scan
Journal of Electronic Testing: Theory and Applications
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