The Ballast Methodology for Structured Partial Scan Design
IEEE Transactions on Computers
A Partial Scan Method for Sequential Circuits with Feedback
IEEE Transactions on Computers
An optimal algorithm for cycle breaking in directed graphs
Journal of Electronic Testing: Theory and Applications - Special issue on partial scan methods
On generating compact test sequences for synchronous sequential circuits
EURO-DAC '95/EURO-VHDL '95 Proceedings of the conference on European design automation
Partial scan design based on circuit state information
DAC '96 Proceedings of the 33rd annual Design Automation Conference
An effective test generation system for sequential circuits
DAC '86 Proceedings of the 23rd ACM/IEEE Design Automation Conference
A New Method for Partial Scan Design Based on Propagation and Justification Requirements of Faults
Proceedings of the IEEE International Test Conference on Driving Down the Cost of Test
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
A Graph Theoretic Approach to Partial Scan Design by K-Cycle Elimination
Proceedings of the IEEE International Test Conference on Discover the New World of Test and Design
Parial Scan Using Reverse Direction Empirical Testability
Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
A logic design structure for LSI testability
DAC '77 Proceedings of the 14th Design Automation Conference
Improving topological ATPG with symbolic techniques
VTS '95 Proceedings of the 13th IEEE VLSI Test Symposium
HITEC: a test generation package for sequential circuits
EURO-DAC '91 Proceedings of the conference on European design automation
| Hi-index | 0.00 |