Identification of unsettable flip-flops for partial scan and faster ATPG
Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design
Layout Driven Selection and Chaining of Partial Scan Flip-Flops
Journal of Electronic Testing: Theory and Applications
Full scan fault coverage with partial scan
DATE '99 Proceedings of the conference on Design, automation and test in Europe
ITEM: an iterative improvement test generation procedure for synchronous sequential circuits
GLSVLSI '01 Proceedings of the 11th Great Lakes symposium on VLSI
Partial Scan Testing on the Register-Transfer Level
Journal of Electronic Testing: Theory and Applications
A Practical Method for Selecting Partial Scan Flip-flops for Large Circuits
VLSID '97 Proceedings of the Tenth International Conference on VLSI Design: VLSI in Multimedia Applications
Partial Scan Using Multi-Hop State Reachability Analysis
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
A user-friendly interface for evaluating preference queries over tabular data
Proceedings of the 26th annual ACM international conference on Design of communication
Engineering Applications of Artificial Intelligence
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