Selecting partial scan flip-flops for circuit partitioning
ICCAD '94 Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design
Implicit computation of minimum-cost feedback-vertex sets for partial scan and other applications
DAC '94 Proceedings of the 31st annual Design Automation Conference
An exact algorithm for selecting partial scan flip-flops
DAC '94 Proceedings of the 31st annual Design Automation Conference
Incremental Testability Analysis for Partial Scan Selection and Design Transformations
Journal of Electronic Testing: Theory and Applications - Special issue on the IEEE European Test Workshop
ITEM: an iterative improvement test generation procedure for synchronous sequential circuits
GLSVLSI '01 Proceedings of the 11th Great Lakes symposium on VLSI
Partial Scan Testing on the Register-Transfer Level
Journal of Electronic Testing: Theory and Applications
Performance Analysis of Asynchronous Circuits Using Markov Chains
Concurrency and Hardware Design, Advances in Petri Nets
A Practical Method for Selecting Partial Scan Flip-flops for Large Circuits
VLSID '97 Proceedings of the Tenth International Conference on VLSI Design: VLSI in Multimedia Applications
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