Partial scan selection for user-specified fault coverage
EURO-DAC '95/EURO-VHDL '95 Proceedings of the conference on European design automation
A Novel Approach to Random Pattern Testing of Sequential Circuits
IEEE Transactions on Computers
ITEM: an iterative improvement test generation procedure for synchronous sequential circuits
GLSVLSI '01 Proceedings of the 11th Great Lakes symposium on VLSI
Random pattern testing for sequential circuits revisited
FTCS '96 Proceedings of the The Twenty-Sixth Annual International Symposium on Fault-Tolerant Computing (FTCS '96)
Sequential Circuit Testing: From DFT to SFT
VLSID '97 Proceedings of the Tenth International Conference on VLSI Design: VLSI in Multimedia Applications
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