Combinatorial optimization: algorithms and complexity
Combinatorial optimization: algorithms and complexity
The Ballast Methodology for Structured Partial Scan Design
IEEE Transactions on Computers
A Partial Scan Method for Sequential Circuits with Feedback
IEEE Transactions on Computers
An analytical approach to the partial scan problem
Journal of Electronic Testing: Theory and Applications
Design for testability for path delay faults in sequential circuits
DAC '93 Proceedings of the 30th international Design Automation Conference
Resynthesis and retiming for optimum partial scan
DAC '94 Proceedings of the 31st annual Design Automation Conference
Exploiting hardware sharing in high-level synthesis for partial scan optimization
ICCAD '93 Proceedings of the 1993 IEEE/ACM international conference on Computer-aided design
Designing Circuits with Partial Scan
IEEE Design & Test
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
PSBIST: A Partial-Scan Based Built-In Self-Test Scheme
Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
On Selecting Flip-Flops for Partial Reset
Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
Parial Scan Using Reverse Direction Empirical Testability
Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
Partial scan designs without using a separate scan clock
VTS '95 Proceedings of the 13th IEEE VLSI Test Symposium
HITEC: a test generation package for sequential circuits
EURO-DAC '91 Proceedings of the conference on European design automation
On the selection of a partial scan path with respect to target faults
EURO-DAC '91 Proceedings of the conference on European design automation
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