Partial Scan Design Based on State Transition Modeling

Full scan fault coverage with partial scan

DATE '99 Proceedings of the conference on Design, automation and test in Europe

A Non-Scan Approach to DFT for Controllers Achieving 100% Fault Efficiency

Journal of Electronic Testing: Theory and Applications - Special Issue on the 7th ASIAN TEST SYMPOSIUM, ATS-98

Exploiting symbolic techniques for partial scan flip flop selection

Proceedings of the conference on Design, automation and test in Europe

Partial Scan Using Multi-Hop State Reachability Analysis

VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium

Partial Scan Design Based on Circuit State Information and Functional Analysis

IEEE Transactions on Computers

Eliminating the Timing Penalty of Scan

Journal of Electronic Testing: Theory and Applications