The Multiple Observation Time Test Strategy
IEEE Transactions on Computers - Special issue on fault-tolerant computing
On Removing Redundancies from Synchronous Sequential Circuits with Synchronizing Sequences
IEEE Transactions on Computers
Full scan fault coverage with partial scan
DATE '99 Proceedings of the conference on Design, automation and test in Europe
Proptest: a property based test pattern generator for sequential circuits using test compaction
Proceedings of the 36th annual ACM/IEEE Design Automation Conference
Techniques for improving the efficiency of sequential circuit test generation
ICCAD '99 Proceedings of the 1999 IEEE/ACM international conference on Computer-aided design
Classification of Faults in Synchronous Sequential Circuits
IEEE Transactions on Computers
Random pattern testing for sequential circuits revisited
FTCS '96 Proceedings of the The Twenty-Sixth Annual International Symposium on Fault-Tolerant Computing (FTCS '96)
MIX: A Test Generation System for Synchronous Sequential Circuits
VLSID '98 Proceedings of the Eleventh International Conference on VLSI Design: VLSI for Signal Processing
8.3 On Removing Redundant Faults in Synchronous Sequential Circuits
VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium
Procedures for Identifying Undetectable and Redundant Faults In Synchronous Sequential Circuits
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
A Fault Simulation Based Test Pattern Generator for Synchronous Sequential Circuits
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
Vector restoration based static compaction of test sequences for synchronous sequential circuits
ICCD '97 Proceedings of the 1997 International Conference on Computer Design (ICCD '97)
On Finding Undetectable and Redundant Faults in Synchronous Sequential Circuits
ICCD '98 Proceedings of the International Conference on Computer Design
LOCSTEP: a logic-simulation-based test generation procedure
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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