HEC: improving endurance of high performance flash-based cache devices

  • Authors:
  • Jingpei Yang;Ned Plasson;Greg Gillis;Nisha Talagala

  • Affiliations:
  • Swaminathan Sundararaman, Robert Wood, Fusion-io, Inc.;Swaminathan Sundararaman, Robert Wood, Fusion-io, Inc.;Swaminathan Sundararaman, Robert Wood, Fusion-io, Inc.;Swaminathan Sundararaman, Robert Wood, Fusion-io, Inc.

  • Venue:
  • Proceedings of the 6th International Systems and Storage Conference
  • Year:
  • 2013

Quantified Score

Hi-index 0.00

Visualization

Abstract

Flash memory is widely used for its fast random I/O access performance in a gamut of enterprise storage applications. However, due to the limited endurance and asymmetric write performance of flash memory, minimizing writes to a flash device is critical for both performance and endurance. Previous studies have focused on flash memory as a candidate for primary storage devices; little is known about its behavior as a Solid State Cache (SSC) device. In this paper, we propose HEC, a High Endurance Cache that aims to improve overall device endurance via reduced media writes and erases while maximizing cache hit rate performance. We analyze the added write pressures that cache workloads place on flash devices and propose optimizations at both the cache and flash management layers to improve endurance while maintaining or increasing cache hit rate. We demonstrate the individual and cumulative contributions of cache admission policy, cache eviction policy, flash garbage collection policy, and flash device configuration on a) hit rate, b) overall writes, and c) erases as seen by the SSC device. Through our improved cache and flash optimizations, 83% of the analyzed workload ensembles achieved increased or maintained hit rate with write reductions up to 20x, and erase count reductions up to 6x.