Thermal monitoring on FPGAs using ring-oscillators
FPL '97 Proceedings of the 7th International Workshop on Field-Programmable Logic and Applications
Physical unclonable functions for device authentication and secret key generation
Proceedings of the 44th annual Design Automation Conference
FPGA Intrinsic PUFs and Their Use for IP Protection
CHES '07 Proceedings of the 9th international workshop on Cryptographic Hardware and Embedded Systems
Proceedings of the 2008 IEEE/ACM International Conference on Computer-Aided Design
Thermal sensor allocation and placement for reconfigurable systems
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Power-Up SRAM State as an Identifying Fingerprint and Source of True Random Numbers
IEEE Transactions on Computers
Proceedings of the 46th Annual Design Automation Conference
Modeling attacks on physical unclonable functions
Proceedings of the 17th ACM conference on Computer and communications security
Improving the quality of ring oscillator PUFs on FPGAs
WESS '10 Proceedings of the 5th Workshop on Embedded Systems Security
A PUF design for secure FPGA-based embedded systems
Proceedings of the 2010 Asia and South Pacific Design Automation Conference
An analysis of delay based PUF implementations on FPGA
ARC'10 Proceedings of the 6th international conference on Reconfigurable Computing: architectures, Tools and Applications
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Physically unclonable functions (PUF) are commonly used in applications such as hardware security and intellectual property protection. Various PUF implementation techniques have been proposed to translate chip-specific variations into a unique binary string. It is difficult to maintain repeatability of chip ID generation, especially over a wide range of operating conditions. To address this problem, we propose utilizing configurable ring oscillators and an orthogonal re-initialization scheme to improve repeatability. An implementation on a Xilinx Spartan-3e field-programmable gate array was tested on nine different chips. Experimental results show that the bit flip rate is reduced from 1.5% to approximately 0 at a fixed supply voltage and room temperature. Over a 20 °C-80 °C temperature range and 25% variation in supply voltage, the bit flip rate is reduced from 1.56% to 3.125 × 10-7.