Test point insertion: scan paths through combinational logic

Authors:
Chih-chang Lin;Malgorzata Marek-Sadowska;Kwang-Ting Cheng;Mike Tien-Chien Lee
Affiliations:
Mentor Graphics, San Jose, CA;Univ. of California, Santa Barbara, CA;Univ. of California, Santa Barbara, CA;Fujitsu Lab. of America, Santa Clara, CA
Venue:
DAC '96 Proceedings of the 33rd annual Design Automation Conference
Year:
1996

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