Test response compaction for built-in self testing

Design of Aliasing Free Space Compressor in BIST with Maximal Compaction Ratio Using Concepts of Strong and Weak Compatibilities of Response Data Outputs and Generalized Sequence Mergeability

IWDC '02 Proceedings of the 4th International Workshop on Distributed Computing, Mobile and Wireless Computing

Aliasing-Free Compaction In Testing Cores-Based System-On-Chip (SOC) Using Compatibility Of Response Data Outputs

Journal of Integrated Design & Process Science

Altera max plus II development environment in fault simulation and test implementation of embedded

IWDC'04 Proceedings of the 6th international conference on Distributed Computing

Implementation of embedded cores-based digital devices in JBits java simulation environment

CIT'04 Proceedings of the 7th international conference on Intelligent Information Technology