Implementation of embedded cores-based digital devices in JBits java simulation environment

Authors:
Mansour H. Assaf;Rami S. Abielmona;Payam Abolghasem;Sunil R. Das;Emil M. Petriu;Voicu Groza;Mehmet Sahinoglu
Affiliations:
School of Information Technology and Engineering, Faculty of Engineering, University of Ottawa, Ottawa, Ontario, Canada;School of Information Technology and Engineering, Faculty of Engineering, University of Ottawa, Ottawa, Ontario, Canada;School of Information Technology and Engineering, Faculty of Engineering, University of Ottawa, Ottawa, Ontario, Canada;School of Information Technology and Engineering, Faculty of Engineering, University of Ottawa, Ottawa, Ontario, Canada;School of Information Technology and Engineering, Faculty of Engineering, University of Ottawa, Ottawa, Ontario, Canada;School of Information Technology and Engineering, Faculty of Engineering, University of Ottawa, Ottawa, Ontario, Canada;Department of Computer and Information Science, Troy State University Montgomery, Montgomery, AL
Venue:
CIT'04 Proceedings of the 7th international conference on Intelligent Information Technology
Year:
2004

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Abstract

This paper proposes test design architecture suitable for built-in self-testing (BIST) of embedded cores-based digital circuits by using a reconfigurable device. In the paper, a sample circuit under test (CUT) and its corresponding space compressor were realized in Java language, downloaded, and then tested at runtime in a simulation environment written in JBits.