Built-in test for VLSI: pseudorandom techniques
Built-in test for VLSI: pseudorandom techniques
A Data Compression Technique for Built-In Self-Test
IEEE Transactions on Computers
Optimal Robust Compression of Test Responses
IEEE Transactions on Computers
Aliasing Probability for Multiple Input Signature Analyzer
IEEE Transactions on Computers
IBM Journal of Research and Development
Production Experience with Built-In Self-Test in the IBM ES/9000 System
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
IWDC '02 Proceedings of the 4th International Workshop on Distributed Computing, Mobile and Wireless Computing
Test-Per-Clock Logic BIST with Semi-Deterministic Test Patterns and Zero-Aliasing Compactor
Journal of Electronic Testing: Theory and Applications
Journal of Integrated Design & Process Science
X-align: improving the scan cell observability of response compactors
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Altera max plus II development environment in fault simulation and test implementation of embedded
IWDC'04 Proceedings of the 6th international conference on Distributed Computing
Implementation of embedded cores-based digital devices in JBits java simulation environment
CIT'04 Proceedings of the 7th international conference on Intelligent Information Technology
| Hi-index | 14.98 |
Multiple-input signature registers (MISRs) are commonly used in built-in self-test (BIST) applications. The size of the MISR is dictated by the number of signals it has to compress. Normally a MISR includes a stage for every signal that it is sampling. In some applications this leads to very wide MISRs that may include several hundred stages.Large size MISRs pose problems in terms of hardware and wiring overhead. Shorter compressors are, therefore, needed.This paper investigates the problem of reducing the MISR so that it samples multiple signals at every stage. Issues like detection probability loss, test length penalty, fault coverage degradation, are some of the disadvantages that may arise from the MISR shrinkage. This paper analyzes all these issues; shows ways to reduce their negative effect, and compares the results to previously published proposals.