A parallel branch and bound algorithm for test generation
DAC '89 Proceedings of the 26th ACM/IEEE Design Automation Conference
Efficient implementation of a BDD package
DAC '90 Proceedings of the 27th ACM/IEEE Design Automation Conference
Parallel test generation for sequential circuits on general-purpose multiprocessors
DAC '91 Proceedings of the 28th ACM/IEEE Design Automation Conference
Sequential circuit test generation on a distributed system
DAC '93 Proceedings of the 30th international Design Automation Conference
Portable parallel test generation for sequential circuits
ICCAD '92 Proceedings of the 1992 IEEE/ACM international conference on Computer-aided design
Distributed Test Pattern Generation for Stuck-At Faults in Sequential Circuits
Journal of Electronic Testing: Theory and Applications
Test Generation for Path Delay Faults Using Binary Decision Diagrams
IEEE Transactions on Computers
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