An effective test generation system for sequential circuits
DAC '86 Proceedings of the 23rd ACM/IEEE Design Automation Conference
SCOAP: Sandia controllability/observability analysis program
DAC '80 Proceedings of the 17th Design Automation Conference
HITEC: a test generation package for sequential circuits
EURO-DAC '91 Proceedings of the conference on European design automation
Performance trade-offs in a parallel test generation/fault simulation environment
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Sequential circuit test generation on a distributed system
DAC '93 Proceedings of the 30th international Design Automation Conference
ProperHITEC: a portable, parallel, object-oriented approach to sequential test generation
DAC '94 Proceedings of the 31st annual Design Automation Conference
Boolean algebraic test generation using a distributed system
ICCAD '93 Proceedings of the 1993 IEEE/ACM international conference on Computer-aided design
Asynchronous parallel algorithms for test set partitioned fault simulation
Proceedings of the eleventh workshop on Parallel and distributed simulation
Distributed Test Pattern Generation for Stuck-At Faults in Sequential Circuits
Journal of Electronic Testing: Theory and Applications
Parallel Algorithms for Force Directed Scheduling of Flattened and Hierarchical Signal Flow Graphs
IEEE Transactions on Computers
Optimal Granularity and Scheme of Parallel Test Generation in a Distributed System
IEEE Transactions on Parallel and Distributed Systems
Overcoming the Serial Logic Simulation Bottleneck in Parallel Fault Simulation
VLSID '97 Proceedings of the Tenth International Conference on VLSI Design: VLSI in Multimedia Applications
SPITFIRE: scalable parallel algorithms for test set partitioned fault simulation
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
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