Asynchronous parallel algorithms for test set partitioned fault simulation

  • Authors:
  • Dilip Krishnaswamy;Prithviraj Banerjee;Elizabeth M. Rudnick;Janak H. Patel

  • Affiliations:
  • Center for Reliable and High-Performance Computing, University of IIlinois, Urbana,IL;Center for Parallel and Distributed Computing, Northwestern University, Evanston, IL;Center for Reliable and High-Performance Computing, University of IIlinois, Urbana,IL;Center for Reliable and High-Performance Computing, University of IIlinois, Urbana,IL

  • Venue:
  • Proceedings of the eleventh workshop on Parallel and distributed simulation
  • Year:
  • 1997

Quantified Score

Hi-index 0.00

Visualization

Abstract

We propose two new asynchronous parallel algorithms for test set partitioned fault simulation. The algorithms are based on a new two-stage approach to parallelizing fault simulation for sequential VLSI circuits in which the test set is partitioned among the available processors. These algorithms provide the same result as the previous synchronous two stage approach. However, due to the dynamic characteristics of these algorithms and due to the fact that there is very minimal redundant work, they run faster than the previous synchronous approach. A theoretical analysis comparing the various algorithms is also given to provide an insight into these algorithms. The implementations were done in MPI and are therefore portable to many parallel platforms. Results are shown for a shared memory multiprocessor.