RICE: Rapid interconnect circuit evaluator
DAC '91 Proceedings of the 28th ACM/IEEE Design Automation Conference
Capturing time-of-flight delay for transient analysis based on scattering parameter macromodel
ICCAD '94 Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design
Delay analysis of the distributed RC line
DAC '95 Proceedings of the 32nd annual ACM/IEEE Design Automation Conference
Stable and efficient reduction of substrate model networks using congruence transforms
ICCAD '95 Proceedings of the 1995 IEEE/ACM international conference on Computer-aided design
Numerical Methods
Domain characterization of transmission line models and analyses
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Efficient linear circuit analysis by Pade approximation via the Lanczos process
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Simulation methods for RF integrated circuits
ICCAD '97 Proceedings of the 1997 IEEE/ACM international conference on Computer-aided design
Realizable reduction for RC interconnect circuits
ICCAD '99 Proceedings of the 1999 IEEE/ACM international conference on Computer-aided design
Proceedings of the 39th annual Design Automation Conference
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This paper presents a new Gaussian quadrature methodfor interconnect modeling which applies to one-dimensionaldistributions of circuit element values, thel ine structuresoften used to model interconnect wires.The method takesa line circuit, which may be an arbitrary combination oflumped and distributed elements, and produces a smalllumped model whose transfer and input characteristic approximatelymay be used to generate lumped models for distributedelements, or to reduce long chains of lumped elements.The method also applies to one-dimensional distributionsof coupling circuit elements, and, in general, toany one-dimensional distribution of circuit element quantities.Several examples demonstrate that the quadrature-basedmethod is capable of automatically generating compactRC, LC and RLC line models with arbitrary accuracy.