Tools and methodology for RF IC design

  • Authors:
  • Al Dunlop;Alper Demir;Peter Feldmann;Sharad Kapur;David Long;Robert Melville;Jaijeet Roychowdhury

  • Affiliations:
  • Bell Laboratories, Murray Hill, NJ;Bell Laboratories, Murray Hill, NJ;Bell Laboratories, Murray Hill, NJ;Bell Laboratories, Murray Hill, NJ;Bell Laboratories, Murray Hill, NJ;Bell Laboratories, Murray Hill, NJ;Bell Laboratories, Murray Hill, NJ

  • Venue:
  • DAC '98 Proceedings of the 35th annual Design Automation Conference
  • Year:
  • 1998

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Abstract

We describe powerful new techniques for the analysis of RF circuits. Next-generation CAD tools based on such techniques should enable RF designers to obtain a more accurate picture of how their circuits will operate. These new simulation capabilities will be essential in order to reduce the number of design iterations needed to produce complex RFICs.