Gracefully Degradable Processor Arrays
IEEE Transactions on Computers
A Study of Two Approaches for Reconfiguring Fault-Tolerant Systolic Arrays
IEEE Transactions on Computers
Journal of Parallel and Distributed Computing
Detailed Modeling and Reliability Analysis of Fault-Tolerant Processor Arrays
IEEE Transactions on Computers
Advanced Computer Architecture: Parallelism,Scalability,Programmability
Advanced Computer Architecture: Parallelism,Scalability,Programmability
Performability Modeling with UltraSAN
IEEE Software
A Combinatorial Analysis of Subcube Reliability in Hypercubes
IEEE Transactions on Computers
On Dependability Evaluation of Mesh-Connected Processors
IEEE Transactions on Computers
Job Scheduling in a Partitionable Mesh Using a Two-Dimensional Buddy System Partitioning Scheme
IEEE Transactions on Parallel and Distributed Systems
Allocating Precise Submeshes in Mesh Connected Systems
IEEE Transactions on Parallel and Distributed Systems
On fault tolerance of 3-dimensional mesh networks
Journal of Computer Science and Technology
Probabilistic analysis on mesh network fault tolerance
Journal of Parallel and Distributed Computing
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An analytical model for submesh reliability of mesh-connected systems is proposed in this paper. A mesh is considered operational as long as a functional submesh of the required size is available. We use the principle of inclusion and exclusion to find the exact probability of having a functional submesh within a partition of the mesh. The partitions are taken along either dimension of the mesh. The partitions along the rows are called row partitions (RPs) and along the columns are called column partitions (CPs). The reliability of a partition is then used to approximate the submesh reliability of the system and, thus, this model is called partitioned mesh (PM) model. Instead of using a computationally intensive recursive algorithm as done in the previous work, a closed form approximation of the submesh reliability is derived in this paper. The PM model is validated through simulation and compared with the earlier proposed approximation techniques. It is shown that the PM model provides better approximations for submesh reliability with constant computational complexity.