Restructuring for Fault-Tolerant Systolic Arrays
IEEE Transactions on Computers
Fault-tolerant wafer-scale architectures for VLSI
ISCA '82 Proceedings of the 9th annual symposium on Computer Architecture
A reconfigurable and fault-tolerant VLSI multiprocessor array
ISCA '81 Proceedings of the 8th annual symposium on Computer Architecture
Extremal Graph Theory
An Efficient Method for Approximating Submesh Reliability of Two-Dimensional Meshes
IEEE Transactions on Parallel and Distributed Systems
IEEE Transactions on Computers
On Dependability Evaluation of Mesh-Connected Processors
IEEE Transactions on Computers
New Architecture and Algorithms for Degradable VLSI/WSI Arrays
COCOON '02 Proceedings of the 8th Annual International Conference on Computing and Combinatorics
A Run-time Reconfiguration Algorithm for VLSI Arrays
VLSID '03 Proceedings of the 16th International Conference on VLSI Design
An improved reconfiguration algorithm for degradable VLSI/WSI arrays
Journal of Systems Architecture: the EUROMICRO Journal
Reconfiguration Algorithms for Power Efficient VLSI Subarrays with Four-Port Switches
IEEE Transactions on Computers
Integrated Row and Column Rerouting for Reconfiguration of VLSI Arrays with Four-Port Switches
IEEE Transactions on Computers
On the reconfiguration algorithm for fault-tolerant VLSI arrays
ICCS'03 Proceedings of the 2003 international conference on Computational science: PartIII
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Presents a critical study of two approaches, the classical RC-cut approach and H.T. Kung and M.S. Lam's (Proc. 1984 MIT Conf. Advanced Res. VLSI p.74-83, 1984) RCS-cut approach, for reconfiguring faulty systolic arrays. The amount of cell (processing element) redundancy needed to ensure successful reconfiguration into an n*n array is considered. It is shown that no polynomial bounded redundancy is sufficient for the classical approach, whereas O(n/sup 2/log n) redundancy is sufficient for the Kung and Lams approach. The number of faulty cells that can be tolerated in a given array regardless of their locations is characterized and derived. It is shown that, for both approaches, in almost all cases a square array has better fault tolerance than a rectangular array having the same number of cells. A minimal fault pattern in a 2n*2n array with 3n+1 faults that is not reconfigurable into an n*n array using either of the two approaches is established.