Configuration of VLSI Arrays in the Presence of Defects
Journal of the ACM (JACM)
A Study of Two Approaches for Reconfiguring Fault-Tolerant Systolic Arrays
IEEE Transactions on Computers
Fault Tolerance in VLSI Circuits
Computer
A Comprehensive Reconfiguration Scheme for Fault-Tolerant VLSI/WSI Array Processors
IEEE Transactions on Computers
IEEE Transactions on Computers
An Efficient Reconfiguration Algorithm for Degradable VLSI/WSI Arrays
IEEE Transactions on Computers
Harvesting Through Array Partitioning: A Solution to Achieve Defect Tolerance
DFT '97 1997 Workshop on Defect and Fault-Tolerance in VLSI Systems
Efficient Spare Allocation for Reconfigurable Arrays
IEEE Design & Test
Wafer-Scale Integration of Systolic Arrays
IEEE Transactions on Computers
IEEE Transactions on Computers
On the reconfiguration of degradable VLSI/WSI arrays
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Hi-index | 0.00 |
In this paper, an improved algorithm is presented for the NP-complete problem of reconfiguring a two-dimensional degradable VLSI array under the row and column routing constraints. The proposed algorithm adopts the partial computing for the logical row exclusion so that the most efficient algorithm, cited in literature, is speeded up without loss of performance. In addition, a flaw in the earlier approach is also addressed. Experimental results show that our algorithm is approximately 50% faster than the above stated algorithm.