A Heuristic Measure to Maximize Detected Faults per Test

Authors:
Kim T. Le;Kewal K. Saluja
Affiliations:
Information Sciences and Engineering, University of Canberra, P.O. Box 1, Belconnen, ACT-2616, Australia. E-mail: kiml@ise.canberra.edu.au;Electrical and Computer Engineering, University of Wisconsin-Madison, Madison, WI 53706, USA. E-mail: saluja@engr.wisc.edu
Venue:
Journal of Electronic Testing: Theory and Applications
Year:
1998

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Abstract

In this paper we introduce a new measure for target fault selection and backtrace during test generation. The measure incorporates information on undetected faults and hence attempts to maximizethe number of additional faults that may be detected by each test vector.Experimental results show the usefulness of this heuristic and demonstrate its superiority over the use of the SCOAP measure.