PATEGE: an automatic DC parametric test generation system for series gated ECL circuits

Authors:
Takuji Ogihara;Shuichi Saruyama;Shinichi Murai
Affiliations:
Mitsubishi Electric Corporation, 325 Kamimachiya, Kamakura 247, Japan;Mitsubishi Electric Corporation, 325 Kamimachiya, Kamakura 247, Japan;Mitsubishi Electric Corporation, 325 Kamimachiya, Kamakura 247, Japan
Venue:
DAC '85 Proceedings of the 22nd ACM/IEEE Design Automation Conference
Year:
1985

Citing 4
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Abstract

For ECL circuits. DC parametric tests such as input current (IIL IIH), reference voltage (VBB), and power supply current (ICC) tests are executed as well as functional tests.This paper describes: an automatic DC parametric test generation system PATEGE for the series gated ECL circuits. PATEGE can automatically generate the test patterns and calculate the expected values for IIL, IIH, VBB and ICC tests.