Design-for-testability of PLA's using statistical cooling

Authors:
Michiel M. Ligthart;Emile H. L. Aarts;Frans P. M. Beenker
Affiliations:
Signetics, Sunnyvale, CA and Philips Research Laboratories, P.O. Box 80000, 5600 JA Eindhoven, the Netherlands;Philips Research Laboratories, P.O. Box 80000, 5600 JA Eindhoven, the Netherlands;Philips Research Laboratories, P.O. Box 80000, 5600 JA Eindhoven, the Netherlands
Venue:
DAC '86 Proceedings of the 23rd ACM/IEEE Design Automation Conference
Year:
1986

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Abstract

A method for designing easily testable PLA's with low overhead is presented. The method is based on a reduction of product lines and the addition of a small number of inputs. The required additional hardware is calculated using a statistical cooling algorithm. The presented design-for-testability method guarantees a 100 percent fault coverage with respect to multiple stuck-at faults and multiple missing/extra crosspoint faults.